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Digital-to-analog converter
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#	Item
801	ADC Driver Selection Guide Add to Reading List Source URL: www.analog.com Language: English - Date: 2012-09-21 12:36:32 Electronic circuits Electromagnetism Measurement Noise Analog-to-digital converter Effective number of bits Analog Devices Differential amplifier Comparator Digital signal processing Electronics Electronic engineering
802	Application Note AN_180 FT232H MPSSE Example - USB Current Meter using the SPI Interface Rev 1.0 Issue Date: [removed] Add to Reading List Source URL: www.ftdichip.com Language: English - Date: 2012-05-14 07:23:45 Electronic circuits Microcontrollers Universal Serial Bus Analog-to-digital converter USB flash drive Serial Peripheral Interface Bus Resistor FTDI I²C Computer hardware Electronics Technology
803	STRONG MOTION DATA PROCESSING AND RECORDING AT UNIVERSITY OF SOUTHERN CALIFORNIA MARIA I. TODOROVSKA and VINCENT W. LEE Civil and Environmental Engineering Department University of Southern California Los Angeles, CA 900 Add to Reading List Source URL: www.cosmos-eq.org Language: English - Date: 2010-01-06 21:43:36 Data transmission Digitizing Video game development Image scanner Digital signal processing Analog-to-digital converter Electronic engineering Telecommunications engineering Electronics
804	ARMY STTR 14.A PROPOSAL SUBMISSION INSTRUCTIONS The approved FY14.A topics solicited for in the Army’s Small Business Technology Transfer (STTR) Program are listed below. Offerors responding to the Army STTR FY14.A Sol Add to Reading List Source URL: www.acq.osd.mil Language: English Small Business Administration Small Business Innovation Research Noise Noise regulation Radio Signal-to-noise ratio Synthetic aperture radar Digital-to-analog converter Electronics Technology Measurement
805 $Analog-to-digital converter / Integral nonlinearity / LTX / Differential nonlinearity / Static testing / David / Technology / Nevi\'im / Bible / Digital signal processing / Electronic circuits / Digital-to-analog converter$	P1658 Digital to Analog Standard Meeting, October 16, 2007 Hosted by LTX Corporation, Norwood, MA Modified: 7-November-2007 Attendees: Steve Tilden, Texas Instruments (Chair) Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-11-07 21:08:21 Analog-to-digital converter Integral nonlinearity LTX Differential nonlinearity Static testing David Technology Nevi\'im Bible Digital signal processing Electronic circuits Digital-to-analog converter
806	VOLUME 28 JOURNAL OF ATMOSPHERIC AND OCEANIC TECHNOLOGY DECEMBER 2011 Add to Reading List Source URL: www.nssl.noaa.gov Language: English - Date: 2013-04-15 17:36:59 Telecommunications engineering Oversampling Matched filter Sampling Autocovariance Estimation theory Digital-to-analog converter Signal-to-noise ratio Variance Statistics Digital signal processing Signal processing
807	Minutes of 1241 Standards Committee Meeting in Gaithersburg, Maryland USA – February 15, 2006 Minutes Prepared by: Solomon Max – 2006-Feb-23 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Conver Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-03-07 08:41:55 International Multimedia Telecommunications Consortium Spurious-free dynamic range Digital signal processing Analog-to-digital converter Sampling
808	TC[removed]Minutes page 1 of[removed]:23 PM Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-05-16 17:24:55 Electrical engineering Analog-to-digital converter Effective number of bits Quantization error Spurious-free dynamic range Delta-sigma modulation Digital-to-analog converter SINAD Sampling Digital signal processing Electronics Electromagnetism
809	OWNER’S MANUAL Dx[removed]BIT DIGITAL SOUND SYSTEM PROCESSOR IMPORTANT SAFETY INSTRUCTIONS Add to Reading List Source URL: step.polymtl.ca Language: English - Date: 2012-03-20 15:20:37 Power supply Analog-to-digital converter Electronics Electromagnetism Electrical engineering Light-emitting diode Lighting Signage
810	Minutes of 1241 Standards Committee Meeting in Norwood, Massachusetts USA – June 4-5, 2009 Minutes Prepared by: Solomon Max – 2009-June-9 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converter Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2009-06-12 17:48:38 WebEx Electronic engineering Electronics Technology LTX Credence Systems Tilden

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